The Swagelok Center for Surface Analysis of Materials will host a one-day short course on structural and compositional analysis solutions Monday, Oct. 23, from 9 a.m. to 5 p.m. in the Glennan Building. The event is open to graduate students, postdoctoral fellows, faculty and anyone interested in microscopy and surface analysis.
The morning session runs from 9 a.m. to noon and includes such topics as X-ray photoelectron spectroscopy, auger electron spectroscopy and X-ray diffraction. The afternoon session runs from 1 to 5 p.m. and will cover topics from scanning electron microscopy to electron backscatter diffraction to atomic force microscopy.
Refreshments will be served in the morning and during the lunch break.
To register, email Sharon Dingess at email@example.com and use “2017 registration for SCSAM short course” in the subject line.